<?xml version="1.0" encoding="UTF-8"?>
<rss version="2.0"
	xmlns:content="http://purl.org/rss/1.0/modules/content/"
	xmlns:wfw="http://wellformedweb.org/CommentAPI/"
	xmlns:dc="http://purl.org/dc/elements/1.1/"
	xmlns:atom="http://www.w3.org/2005/Atom"
	xmlns:sy="http://purl.org/rss/1.0/modules/syndication/"
	xmlns:slash="http://purl.org/rss/1.0/modules/slash/"
	>

<channel>
	<title>Test Equipment Connection &#187; 2010</title>
	<atom:link href="http://blog.testequipmentconnection.com/tag/2010/feed" rel="self" type="application/rss+xml" />
	<link>http://blog.testequipmentconnection.com</link>
	<description>Quality refurbished test equipment</description>
	<lastBuildDate>Wed, 09 Mar 2022 14:42:21 +0000</lastBuildDate>
	<language>en-US</language>
		<sy:updatePeriod>hourly</sy:updatePeriod>
		<sy:updateFrequency>1</sy:updateFrequency>
	<generator>https://wordpress.org/?v=3.9.40</generator>
	<item>
		<title>LeCroy LogicStudio Demo Video</title>
		<link>http://blog.testequipmentconnection.com/lecroy-logicstudio-demo-video</link>
		<comments>http://blog.testequipmentconnection.com/lecroy-logicstudio-demo-video#comments</comments>
		<pubDate>Thu, 11 Nov 2010 17:42:37 +0000</pubDate>
		<dc:creator><![CDATA[Mike Novello]]></dc:creator>
				<category><![CDATA[Product News]]></category>
		<category><![CDATA[2010]]></category>
		<category><![CDATA[analyser]]></category>
		<category><![CDATA[analyzer]]></category>
		<category><![CDATA[Demo]]></category>
		<category><![CDATA[Embedded Systems Conference]]></category>
		<category><![CDATA[history mode]]></category>
		<category><![CDATA[I2C]]></category>
		<category><![CDATA[LeCroy]]></category>
		<category><![CDATA[LeCroy Demo]]></category>
		<category><![CDATA[LeCroy Demo Video at the 2010 Embedded Systems Conference]]></category>
		<category><![CDATA[LeCroy Logic Studio Demo]]></category>
		<category><![CDATA[logic analysers]]></category>
		<category><![CDATA[logic analyzers]]></category>
		<category><![CDATA[Logic Studio]]></category>
		<category><![CDATA[SPI]]></category>
		<category><![CDATA[timing cursors]]></category>
		<category><![CDATA[UART decoding]]></category>
		<category><![CDATA[Video]]></category>

		<guid isPermaLink="false">http://blog.testequipmentconnection.com/?p=1155</guid>
		<description><![CDATA[LeCroy Demo at the 2010 Embedded Systems Conference LeCroy LogicStudio Logic Analyzers &#8211; Logic analyzers are known to be slow, complicated and expensive but Logic Studio changes all this by delivering a powerful feature set, high performance hardware and an &#8230; <a href="http://blog.testequipmentconnection.com/lecroy-logicstudio-demo-video">Read More <span class="meta-nav">&#8594;</span></a>]]></description>
				<content:encoded><![CDATA[<h1 style="text-align: center;">LeCroy Demo at the 2010 Embedded Systems Conference</h1>
<p><object width="640" height="505" data="http://www.youtube.com/v/msg42dHKXDQ?fs=1&amp;hl=en_US&amp;rel=0&amp;color1=0x234900&amp;color2=0x4e9e00" type="application/x-shockwave-flash"><param name="allowFullScreen" value="true" /><param name="allowscriptaccess" value="always" /><param name="src" value="http://www.youtube.com/v/msg42dHKXDQ?fs=1&amp;hl=en_US&amp;rel=0&amp;color1=0x234900&amp;color2=0x4e9e00" /><param name="allowfullscreen" value="true" /></object></p>
<p><a href="http://www.testequipmentconnection.com/products/54184"><img class="alignleft" src="http://www.testequipmentconnection.com/images/LeCroy-LogicStudio.jpg" alt="" width="350" height="160" /></a></p>
<p style="text-align: justify;"><strong>LeCroy LogicStudio Logic Analyzers</strong> &#8211; Logic analyzers are known to be slow, complicated and expensive but Logic Studio changes all this by delivering a powerful feature set, high performance hardware and an intuitive point and click user-interface. With timing cursors, history mode, I2C, SPI and UART decoding, powerful triggering and simple navigation the PC is transformed in to an all-in-one debug machine. Pair the LogicStudio 16 with a WaveJet 300A oscilloscope and debug systems with analog, digital and serial data signals.</p>
<p style="text-align: justify;"><strong>Unique Feature Set</strong></p>
<p style="text-align: justify;">From basic tools like timing cursors that snap to the edge of a waveform to protocol decoding of I2C, SPI and UART busses LogicStudio provides a rich feature set for faster, smarter debug. History mode will display previously captured data and the powerful, flexible triggering will help solve the most complicated problems.</p>
<p style="text-align: justify;"><strong>Easy to Use</strong></p>
<p style="text-align: justify;">The intuitive user-interface works with basic mouse operations. To pan the waveforms simply click and drag, Use the mouse wheel to zoom in or scan the waveforms with the magnification toll to get a great view of the details. With all the debug tools accessible from the main screen, debugging is simple, efficient and just 1 mouse click away.</p>
<p style="text-align: justify;"><strong>Digital, Serial, Analog</strong></p>
<p>Turn the PC into a mixed signal oscilloscope by connecting both a LogicStudio 16 and a WaveJet 300A oscilloscope. View digital, serial and analog waveforms simultaneously, directly on the PC display. This combination of waveforms provides insight that a traditional logic analyzer cannot.  <a href="http://www.testequipmentconnection.com/products/54184#reqQuoteDefault" target="_blank"></a></p>
<p><a href="http://www.testequipmentconnection.com/products/54184#reqQuoteDefault" target="_blank">Request Your Quote HERE</a></p>
<!-- Start Shareaholic Recommendations Automatic --><!-- End Shareaholic Recommendations Automatic -->]]></content:encoded>
			<wfw:commentRss>http://blog.testequipmentconnection.com/lecroy-logicstudio-demo-video/feed</wfw:commentRss>
		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>World Metrology Day Theme &#8211; A Bridge to Innovation</title>
		<link>http://blog.testequipmentconnection.com/world-metrology-day-theme-a-bridge-to-innovation</link>
		<comments>http://blog.testequipmentconnection.com/world-metrology-day-theme-a-bridge-to-innovation#comments</comments>
		<pubDate>Tue, 18 May 2010 13:29:00 +0000</pubDate>
		<dc:creator><![CDATA[Mike Novello]]></dc:creator>
				<category><![CDATA[Events]]></category>
		<category><![CDATA[2010]]></category>
		<category><![CDATA[Bridge to Innovation]]></category>
		<category><![CDATA[Calibrators]]></category>
		<category><![CDATA[commercial]]></category>
		<category><![CDATA[Fluke]]></category>
		<category><![CDATA[industrial]]></category>
		<category><![CDATA[International Bureau of Weights and Measures]]></category>
		<category><![CDATA[Kingsine]]></category>
		<category><![CDATA[laboratories]]></category>
		<category><![CDATA[Martel]]></category>
		<category><![CDATA[May 20]]></category>
		<category><![CDATA[measurements]]></category>
		<category><![CDATA[Metre Convention]]></category>
		<category><![CDATA[National Institute of Standards and Technology]]></category>
		<category><![CDATA[National systems of measurement]]></category>
		<category><![CDATA[New]]></category>
		<category><![CDATA[NIST]]></category>
		<category><![CDATA[refurbished]]></category>
		<category><![CDATA[science]]></category>
		<category><![CDATA[second hand]]></category>
		<category><![CDATA[standards]]></category>
		<category><![CDATA[Technology]]></category>
		<category><![CDATA[Test Equipment]]></category>
		<category><![CDATA[time electronics]]></category>
		<category><![CDATA[United States]]></category>
		<category><![CDATA[used]]></category>
		<category><![CDATA[World Metrology Day]]></category>
		<category><![CDATA[World Metrology Day Theme]]></category>

		<guid isPermaLink="false">http://blog.testequipmentconnection.com/?p=787</guid>
		<description><![CDATA[To recognize the importance of accurate measurements for government, industry and consumers, Test Equipment Connection is celebrating World Metrology Day on May 20. This date in 1875 was the date the Metre Convention was signed. The Convention created the International &#8230; <a href="http://blog.testequipmentconnection.com/world-metrology-day-theme-a-bridge-to-innovation">Read More <span class="meta-nav">&#8594;</span></a>]]></description>
				<content:encoded><![CDATA[<p style="text-align: justify;"><img class="alignleft" src="http://www.testequipmentconnection.net/newsletters/images/dnet_images/world-metrology-day-2010.jpg" alt="" width="243" height="242" /> To recognize the importance of accurate measurements for government, industry and consumers, Test Equipment Connection is celebrating World Metrology Day on May 20. This date in 1875 was the date the Metre Convention was signed. The Convention created the International Bureau of Weights and Measures and set the framework for global collaboration in the science of measurement and its industrial, commercial and societal applications.</p>
<p style="text-align: justify;">According to estimates by the National Institute of Standards and Technology Office of Weights and Measures, sales of products or services impacted by weights and measures laws in the United States represent approximately 50 percent of the U.S. Gross Domestic Product.</p>
<p style="text-align: justify;">During World Metrology Day more than eighty countries will celebrate the impact of measurement on daily life, no part of which is untouched by this essential and largely hidden aspect of modern society. This year’s theme is “Measurements in Science and Technology: Metrology – a Bridge to Innovation.” Previous themes have included topics such as measurements in sport, the environment, medicine and trade. The 2010 theme concentrates on how measurement influences science and stimulates innovation. Science and technology rely on being able to measure correctly and to refer measurements to the same international reference standards. A world without accurate measurement is a world subject to fraud, error and uncertainty.</p>
<p style="text-align: justify;">National systems of measurement must rely on agreed standards and units as well as agreed techniques to make consistent, reproducible and accurate measurements. Each national system is linked into a world-wide network of national measurement standards and laboratories coordinated by the International Bureau of Weights and Measures. In industry and commerce, this standardization helps ensure product quality, eliminate waste and raise productivity and trade based on agreed measurements and tests. It also enables scientists to use a common language to underpin their collaboration across the world and ensure uniformity wherever companies operate.</p>
<p style="text-align: justify;"><img class="alignleft" src="http://www.testequipmentconnection.net/newsletters/images/dnet_images/NIST-Metrology-Day.jpg" alt="" width="140" height="58" /> NIST will hold its fourth annual celebration of World Metrology Day  on Wednesday, May 20, 2010. The Metre Convention was signed on 20 May 1875, a date now celebrated as World Metrology Day. The Convention created the International Bureau of Weights and Measures (BIPM) and set the framework for global collaboration in the science of measurement and in its industrial, commercial and societal application. The original aim of the Metre Convention &#8211; the worldwide uniformity of measurement &#8211; remains as important today, in 2010, as it was in 1875. Join us in celebrating World Metrology Day &#8212; a celebration of our core foundation and purpose! The theme for 2010 is Measurements in Science and Technology; Metrology &#8211; a Bridge to Innovation NIST research and measurements provide a significant foundation for measurements in support of our global economy.  (source www.nist.gov)</p>
<p><a href="http://www.testequipmentconnection.com/manufacturer/Fluke/155" target="_blank">Fluke Calibrators HERE</a></p>
<p><a href="http://www.testequipmentconnection.com/manufacturer/Martel/155" target="_blank">Martel Calibrators HERE</a></p>
<p><a href="http://www.testequipmentconnection.com/manufacturer/Kingsine/155" target="_blank">Kingsine Calibrators HERE</a></p>
<p><a href="http://www.testequipmentconnection.com/manufacturer/Time%20Electronics/155" target="_blank">Time Electronics Calibrators HERE</a></p>
<p><a href="http://www.testequipmentconnection.com/categories/155" target="_blank">New, Refurbished, Second Hand and Pre-owned Calibrators HERE</a></p>
<!-- Start Shareaholic Recommendations Automatic --><!-- End Shareaholic Recommendations Automatic -->]]></content:encoded>
			<wfw:commentRss>http://blog.testequipmentconnection.com/world-metrology-day-theme-a-bridge-to-innovation/feed</wfw:commentRss>
		<slash:comments>0</slash:comments>
		</item>
	</channel>
</rss>
