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Tag Archives: 2010

LeCroy LogicStudio Demo Video

Posted on November 11, 2010 by Mike Novello

LeCroy Demo at the 2010 Embedded Systems Conference LeCroy LogicStudio Logic Analyzers – Logic analyzers are known to be slow, complicated and expensive but Logic Studio changes all this by delivering a powerful feature set, high performance hardware and an … Read More →

Posted in Product News | Tagged 2010, analyser, analyzer, Demo, Embedded Systems Conference, history mode, I2C, LeCroy, LeCroy Demo, LeCroy Demo Video at the 2010 Embedded Systems Conference, LeCroy Logic Studio Demo, logic analysers, logic analyzers, Logic Studio, SPI, timing cursors, UART decoding, Video | Leave a comment

World Metrology Day Theme – A Bridge to Innovation

Posted on May 18, 2010 by Mike Novello

To recognize the importance of accurate measurements for government, industry and consumers, Test Equipment Connection is celebrating World Metrology Day on May 20. This date in 1875 was the date the Metre Convention was signed. The Convention created the International … Read More →

Posted in Events | Tagged 2010, Bridge to Innovation, Calibrators, commercial, Fluke, industrial, International Bureau of Weights and Measures, Kingsine, laboratories, Martel, May 20, measurements, Metre Convention, National Institute of Standards and Technology, National systems of measurement, New, NIST, refurbished, science, second hand, standards, Technology, Test Equipment, time electronics, United States, used, World Metrology Day, World Metrology Day Theme | Leave a comment